STANDARD GUIDE FOR SPECIMEN HANDLING IN AUGER-ELECTRON SPECTROSCOPY, X-RAY PHOTOELECTRON-SPECTROSCOPY, AND SECONDARY ION MASS-SPECTROMETRY (E1078-90)

被引：0
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作者：
不详
机构：
来源：
SURFACE AND INTERFACE ANALYSIS | 1991年 / 17卷 / 13期
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D O I：
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中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
This standard is issued under the fixed designation E1078; the number immediately following the designation indicates the year of original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A superscript epsilon (epsilon) indicates an editorial change since the last revision or reapproval.
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页码：965 / 971
页数：7
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