THE X-RAY DIFFRACTOMETRIC INVESTIGATION OF MULTI-WAVE EFFECTS ON RESOLVED REFLECTIONS

被引：0
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作者：
KSHEVETSKY, SA
MIKHAILYUK, IP
POLYAK, MI
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来源：
KRISTALLOGRAFIYA | 1985年 / 30卷 / 02期
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中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
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页码：252 / 257
页数：6
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