X-RAY FLUOROMETRY - CHEMICAL-ANALYSIS VIA THIN-FILM TECHNIQUE

被引：0
|
作者：
VAZQUEZ, C
DELEYT, DV
机构：
来源：
ANALES DE LA ASOCIACION QUIMICA ARGENTINA | 1992年 / 80卷 / 04期
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Methods for thin films preparation and their applications to different materials via X-ray fluorometry are described. Theoretical principles are discussed and the advantages of this methodology in multicomponent and powder samples determinations are analyzed. The application of this technique for calculations of metallic films thickness in pure elements with different substrata is also discussed.
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页码：305 / 319
页数：15
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