X-RAY IMPACT INDUCED DESORPTION OF GASES FROM SURFACES

被引：0
|
作者：
BRUMBACH, S [1 ]
KAMINSKY, M [1 ]
机构：
[1] ARGONNE NATL LAB,ARGONNE,IL 60439
来源：
JOURNAL OF NUCLEAR MATERIALS | 1976年 / 63卷 / 01期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：188 / 192
页数：5
相关论文
共 50 条
  • [1] Light-induced atom desorption from glass surfaces characterized by X-ray photoelectron spectroscopy
    Kumagai, Ryo
    Hatakeyama, Atsushi
    APPLIED PHYSICS B-LASERS AND OPTICS, 2016, 122 (07):
  • [2] Light-induced atom desorption from glass surfaces characterized by X-ray photoelectron spectroscopy
    Ryo Kumagai
    Atsushi Hatakeyama
    Applied Physics B, 2016, 122
  • [3] X-ray induced ion desorption from transition metal oxalates
    Chenakin, Sergey
    Kruse, Norbert
    APPLIED SURFACE SCIENCE, 2021, 570
  • [4] X-Ray induced desorption and photochemistry in CO ice
    Dupuy, R.
    Bertin, M.
    Feraud, G.
    Romanzin, C.
    Putaud, T.
    Philippe, L.
    Michaut, X.
    Jeseck, P.
    Cimino, R.
    Baglin, V.
    Fillion, J. -H.
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2021, 23 (30) : 15965 - 15979
  • [5] X-ray absorption in gases
    Colvert, WW
    PHYSICAL REVIEW, 1930, 36 (11): : 1619 - 1624
  • [6] GAS RELEASE FROM SURFACES UNDER X-RAY IMPACT - PHOTODESORPTION, PHOTOCATALYSIS
    BRUMBACH, S
    KAMINSKY, M
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1975, 170 (AUG24): : 11 - 11
  • [7] Soft X-ray induced darkening of glass surfaces
    Akutagawa, J
    Yamamoto, D
    Pong, W
    JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1996, 82 (1-2) : 75 - 77
  • [8] X-ray transitions from antiprotonic noble gases
    D. Gotta
    K. Rashid
    B. Fricke
    P. Indelicato
    L. M. Simons
    The European Physical Journal D, 2008, 47 : 11 - 26
  • [9] X-ray transitions from antiprotonic noble gases
    Gotta, D.
    Rashid, K.
    Fricke, B.
    Indelicato, P.
    Simons, L. M.
    EUROPEAN PHYSICAL JOURNAL D, 2008, 47 (01): : 11 - 26
  • [10] X-ray emission from rough surfaces
    Gauvin, R
    Lifshin, E
    MICROBEAM ANALYSIS 2000, PROCEEDINGS, 2000, (165): : 285 - 286
12345