OPTICAL CHARACTERIZATION OF ARSENIC-DOPED SILICA-ON-SILICON WAVE-GUIDES USING FEMTOSECOND OPTICAL-TIME-DOMAIN-REFLECTOMETRY TECHNIQUES

被引：2
|
作者：
MCGOLDRICK, E
BEAUD, P
SCHUTZ, J
HODEL, W
DEUTSCH, C
THOMAS, N
HUBBARD, SA
机构：
[1] UNIV BERN,INST APPL PHYS,CH-3012 BERN,SWITZERLAND
[2] SWISS PTT,CTR TECH,CH-3000 BERN,SWITZERLAND
来源：
OPTICS LETTERS | 1990年 / 15卷 / 23期
关键词：
D O I：
10.1364/OL.15.001354
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Femtosecond OTDR diagnostic techniques are used to investigate the optical properties of arsenic-doped silica-onsilicon waveguides. Results demonstrate that these waveguides have a relatively high refractive index (1.51) and a low loss (<0.5 dB/cm). Owing to the tight optical confinement of the guides, they will have important applications in areas in which high packing densities are required or where direct coupling from semiconductor lasers is needed. © 1990 Optical Society of America.
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页码：1354 / 1356
页数：3
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