LINEWIDTH ENHANCEMENT IN LASER-DIODES CAUSED BY TEMPERATURE-FLUCTUATIONS

被引：7
|
作者：
ZOZ, J
BARABAS, U
机构：
[1] Federal Armed Forces Univ, Neubiberg
来源：
IEE PROCEEDINGS-OPTOELECTRONICS | 1994年 / 141卷 / 03期
关键词：
LINEWIDTH ENHANCEMENT; LASER DIODES; TEMPERATURE FLUCTUATIONS;
D O I：
10.1049/ip-opt:19941084
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In the work, the temperature noise of laser diodes caused by photon and carrier fluctuations is investigated. Therefore, the temperature generating mechanisms are considered, and temperature effects are introduced into the rate equations. The temperature noise results in an increased frequency noise, a broadened linewidth and a linewidth floor at high optical power. To reduce this effect, the thermal resistance and the thermal cutoff frequency must be minimised.
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页码：191 / 194
页数：4
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