PARAMETERIZATION OF RANDOMLY MEASURED POINTS FOR LEAST-SQUARES FITTING OF B-SPLINE CURVES AND SURFACES

被引:320
作者
MA, WY
KRUTH, JP
机构
[1] Division of Production Engineering, Machine Design and Automation, Katholieke Universiteit Leuven, B-3001 Heverlee
关键词
PARAMETERIZATION; INTERPOLATION; B-SPLINE SURFACES;
D O I
10.1016/0010-4485(94)00018-9
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
The paper presents a simple technique to assign parameter values to randomly measured points for the least squares fitting of B-spline surfaces. The parameterization is realized by projecting the measured points to a base surface. The parameters of the projected points are then used as the parameters of the measured points. The base surface is in fact a first approximation of the final fitted surface, and it can usually be created from some approximate boundary information in the form of either points or curves. A similar technique can also be used for B-spline curve fitting.
引用
收藏
页码:663 / 675
页数:13
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