HIGH-RESOLUTION IMAGING OF THE 200-KV TEM WITH DIVERSIFIED FUNCTIONS

被引：0
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作者：
ISAKOZAWA, S [1 ]
机构：
[1] HITACHI LTD,NAKA WORKS,KATSUTA,IBARAKI 312,JAPAN
来源：
JOURNAL OF ELECTRON MICROSCOPY | 1984年 / 33卷 / 01期
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中图分类号：
TH742 [显微镜];
学科分类号：
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页码：78 / 79
页数：2
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