THE REDUCTION OF IRON-OXIDE - INSITU STUDIES USING HIGH-VOLTAGE ELECTRON-MICROSCOPES

被引:0
|
作者
RAU, MF [1 ]
RIECK, D [1 ]
EVANS, JW [1 ]
机构
[1] UNIV CALIF BERKELEY LAWRENCE BERKELEY LAB,DIV MOLEC & MAT RES,BERKELEY,CA 94720
来源
JOURNAL OF METALS | 1983年 / 35卷 / 12期
关键词
D O I
暂无
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
引用
收藏
页码:102 / 102
页数:1
相关论文
共 50 条
  • [1] HIGH-VOLTAGE PERFORMANCE FOR ELECTRON-MICROSCOPES
    EGLE, W
    GUTTER, E
    HOFFMEISTER, D
    MIKROSKOPIE, 1980, 36 (9-10) : 315 - 315
  • [2] HIGH-VOLTAGE, HIGH-RESOLUTION ELECTRON-MICROSCOPES
    LUBKIN, GB
    PHYSICS TODAY, 1974, 27 (05) : 17 - 18
  • [3] TECHNIQUE FOR DETECTION OF IONS IN HIGH-VOLTAGE ELECTRON-MICROSCOPES
    MCKINLEY, GV
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1978, 36 (1-2): : 29 - 33
  • [4] PROPOSED DESIGNS FOR SUPERCONDUCTING LENSES FOR HIGH-VOLTAGE ELECTRON-MICROSCOPES
    BONJOUR, P
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (09): : 761 - 763
  • [5] ELECTRON-OPTICAL PROPERTIES OF SUPERCONDUCTING LENSES FOR HIGH-VOLTAGE ELECTRON-MICROSCOPES
    ATTI, L
    MERLI, PG
    JOURNAL OF SUBMICROSCOPIC CYTOLOGY, 1972, 4 (01): : 128 - &
  • [6] RESOLUTION AND CONTRAST IN HIGH-VOLTAGE SCANNING AND FIXED BEAM ELECTRON-MICROSCOPES
    COWLEY, JM
    SELLAR, JR
    ACTA CRYSTALLOGRAPHICA SECTION A, 1972, 28 : S201 - S201
  • [7] AN OPTICAL REMOTE-CONTROLLED HIGH-VOLTAGE DOME FOR ELECTRON-MICROSCOPES
    RUAN, SY
    KAPP, OH
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (08): : 4313 - 4317
  • [8] CAPACITIVE MEASUREMENTS OF SLOW FLUCTUATIONS IN HIGH-VOLTAGE SUPPLIES FOR ELECTRON-MICROSCOPES
    RUST, HP
    WEISS, K
    ZILSKE, P
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (01): : 71 - 72
  • [9] INSITU DEFORMATION OF THE GAMMA-'-HARDENED SUPERALLOY NIMONIC-PE16 IN HIGH-VOLTAGE ELECTRON-MICROSCOPES
    NEMBACH, E
    SUZUKI, K
    ICHIHARA, M
    TAKEUCHI, S
    PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1985, 51 (04): : 607 - 618
  • [10] Topics in recent studies with high-voltage electron microscopes
    Mori, Hirotaro
    JOURNAL OF ELECTRON MICROSCOPY, 2011, 60 : S189 - S197