PHOTOELECTRON-SPECTROSCOPY BY TIME-OF-FLIGHT TECHNIQUE USING SYNCHROTRON RADIATION

被引:46
作者
BACHRACH, RZ [1 ]
BROWN, FC [1 ]
HAGSTROM, SBM [1 ]
机构
[1] XEROX CORP,RES CTR,PALO ALTO,CA 94304
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY | 1975年 / 12卷 / 01期
关键词
D O I
10.1116/1.568772
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:309 / 312
页数:4
相关论文
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