THICKNESS DEPENDENCE OF THE THERMOELECTRIC-POWER OF TELLURIUM-FILMS

被引：3

作者：

SHARMA, AK ^{[1
]}

机构：

[1] UNIV JODHPUR,DEPT PHYS,FILMS LAB,JODHPUR 342001,RAJASTHAN,INDIA

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1983年 / 77卷 / 01期

关键词：

D O I：

10.1002/pssa.2210770168

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K81 / K85

页数：5

共 50 条

[1] THERMOELECTRIC-POWER OF TELLURIUM-FILMS
CHAUDHURI, S
CHAKRABARTI, B
PAL, AK
THIN SOLID FILMS, 1981, 82 (03) : 217 - 223
[2] THERMOELECTRIC-POWER OF TELLURIUM THIN-FILMS AND ITS THICKNESS AND TEMPERATURE-DEPENDENCE
DAS, VD
JAYAPRAKASH, N
SOUNDARARAJAN, N
JOURNAL OF MATERIALS SCIENCE, 1981, 16 (12) : 3331 - 3334
[3] THICKNESS DEPENDENCE OF THERMOELECTRIC-POWER OF ANTIMONY FILMS
BARUA, K
BARUA, DC
INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1976, 14 (06) : 496 - 498
[4] FILM THICKNESS DEPENDENCE OF MOBILITY IN DEPOSITED TELLURIUM-FILMS
YASUOKA, Y
MIYATA, T
JAPANESE JOURNAL OF APPLIED PHYSICS, 1979, 18 (07) : 1397 - 1398
[5] THERMOELECTRIC PROPERTIES OF VACUUM-DEPOSITED TELLURIUM-FILMS
SHARMA, AK
SINGH, B
INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 1985, 23 (02) : 84 - 86
[6] MICROSTRUCTURE OF TELLURIUM-FILMS
CHAKRABARTI, B
CHAUDHURI, S
MALHOTRA, GL
PAL, AK
JOURNAL OF APPLIED PHYSICS, 1980, 51 (08) : 4111 - 4114
[7] STRUCTURAL DEPENDENCE OF THE SEEBECK EFFECT OF THIN TELLURIUM-FILMS
OZKAPLAN, H
DINNO, MA
SCHWARTZ, M
JOURNAL OF APPLIED PHYSICS, 1979, 50 (03) : 1533 - 1534
[8] DEPENDENCE OF THERMOELECTRIC-POWER OF COPPER-FILMS ON STRUCTURAL DEFECTS
THAKOOR, AP
BHATNAGAR, A
CHOPRA, KL
THIN SOLID FILMS, 1976, 36 (01) : 51 - 54
[9] THIN TELLURIUM-FILMS
MEDYANIK, VN
RESHETOVA, LN
SHULA, GV
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1976, 19 (03) : 916 - 917
[10] THERMOELECTRIC-POWER OF ALUMINUM FILMS
DE, D
BANDYOPADHYAY, SK
CHAUDHURI, S
PAL, AK
JOURNAL OF APPLIED PHYSICS, 1983, 54 (07) : 4022 - 4027

← 1 2 3 4 5 →