TRANSMISSION ELECTRON-MICROSCOPY OBSERVATION OF CRYSTAL DEFECTS IN A NATURAL DIOPSIDE MINERAL

被引:2
|
作者
STALIOS, AD [1 ]
DELAVIGNETTE, P [1 ]
DEBATIST, R [1 ]
机构
[1] ANTWERP STATE UNIV CTR,B-2020 ANTWERP,BELGIUM
来源
关键词
MICROSCOPIC EXAMINATION - Transmission Electron Microscopy - MINERALOGY - Experimental;
D O I
10.1002/pssa.2211070230
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Transmission electron microscopy is used to carry out a number of observations on crystal defects and on alteration reactions in a natural porous diopside mineral. Dislocations as well as stacking faults and grain boundaries are observed. The observations confirm the Burgers and translation vectors found by other authors for diopside i. e. b equals left bracket 001 right bracket , and R parallel left bracket 100 right bracket . A Burgers vector b equals left bracket 101 right bracket , not mentioned in the literature is also determined here. Moreover a topotactic phase transformation is observed and analyzed in the same mineral. This phase is of the amphibole type. The amphibole phase resulted from the diopside phase following an alteration reaction indicating that diopside acted as an open chemical system free to exchange material with its surroundings. The amphibole phase grew on diopside in an orientation corresponding to the prevailing deformation twin orientation of diopside: K//1 equals (100), n//1 equals left bracket 001 right bracket .
引用
收藏
页码:759 / 767
页数:9
相关论文
共 50 条
  • [1] OBSERVATION OF CRYSTAL DEFECTS IN SCANNING ELECTRON-MICROSCOPY
    PITAVAL, M
    MORIN, P
    BAUDRY, J
    FONTAINE, G
    JOURNAL DE PHYSIQUE LETTRES, 1976, 37 (11): : L309 - L312
  • [2] ANALYSIS OF CRYSTAL DEFECTS BY TRANSMISSION ELECTRON-MICROSCOPY
    ARMIGLIATO, A
    MATERIALS CHEMISTRY, 1979, 4 (03): : 453 - 471
  • [3] TRANSMISSION ELECTRON-MICROSCOPY METHODS OF CRYSTAL DEFECT OBSERVATION AND STUDY
    ZBEREA, I
    STUDII SI CERCETARI DE FIZICA, 1972, 24 (10): : 1237 - +
  • [4] OBSERVATION OF PLANAR DEFECTS BY REFLECTION ELECTRON-MICROSCOPY
    TSAI, F
    COWLEY, JM
    ULTRAMICROSCOPY, 1993, 52 (3-4) : 400 - 403
  • [5] OBSERVATION OF CRYSTALLINE DEFECTS IN SCANNING ELECTRON-MICROSCOPY
    MORIN, P
    PITAVAL, M
    BAUDRY, J
    FONTAINE, G
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1976, 1 (03): : 519 - 520
  • [6] ANALYTICAL TRANSMISSION ELECTRON-MICROSCOPY IN MINERAL PROCESSING
    FRASER, HL
    JOURNAL OF METALS, 1980, 32 (12): : 35 - 35
  • [7] TRANSMISSION ELECTRON-MICROSCOPY OBSERVATION OF CDTE SUPERLATTICES
    DICIOCCIO, L
    MILLION, A
    GAILLIARD, JP
    DUPUY, M
    REVUE DE PHYSIQUE APPLIQUEE, 1987, 22 (06): : 465 - 468
  • [8] OBSERVATION OF ZNO CRYSTALS BY TRANSMISSION ELECTRON-MICROSCOPY
    TANEDA, Y
    MIHARA, A
    OJIMA, K
    JOURNAL OF ELECTRON MICROSCOPY, 1985, 34 (03): : 231 - 231
  • [9] TRANSMISSION ELECTRON-MICROSCOPY - DIRECT OBSERVATION OF CRYSTAL-STRUCTURE IN REFRACTORY CERAMICS
    SHAW, TM
    THOMAS, G
    SCIENCE, 1978, 202 (4368) : 625 - 626
  • [10] TRANSMISSION ELECTRON-MICROSCOPY OF EXTENDED CRYSTAL DEFECTS IN PROTON BOMBARDED AND ANNEALED GAAS
    SNYMAN, HC
    NEETHLING, JH
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1983, 69 (3-4): : 199 - 230