QUANTITATIVE-ANALYSIS OF ZN-FE ALLOY GALVANIZED LAYER BY SECONDARY ION MASS-SPECTROMETRY

被引：1

作者：

TAKIMOTO, K

SUZUKI, K

NISIZAKA, K

OHTSUBO, T

机构：

[1] Nippon Steel Corp, Kawasaki, Jpn, Nippon Steel Corp, Kawasaki, Jpn

来源：

TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN | 1986年 / 72卷 / 16期

关键词：

D O I：

10.2355/tetsutohagane1955.72.16_2293

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：2293 / 2300

页数：8

共 50 条

[1] METHODS FOR QUANTITATIVE-ANALYSIS IN SECONDARY ION MASS-SPECTROMETRY
NEWBURY, DE
SCANNING, 1980, 3 (02) : 110 - 118
[2] QUANTITATIVE-ANALYSIS OF LOW-ALLOY STEELS BY SECONDARY ION MASS-SPECTROMETRY
MORGAN, AE
WERNER, HW
ANALYTICAL CHEMISTRY, 1976, 48 (04) : 699 - 708
[3] QUANTITATIVE-ANALYSIS BY THIN-LAYER CHROMATOGRAPHY WITH SECONDARY ION MASS-SPECTROMETRY
BANNO, K
MATSUOKA, M
TAKAHASHI, R
CHROMATOGRAPHIA, 1991, 32 (3-4) : 179 - 181
[4] QUANTITATIVE-ANALYSIS OF ZN-FE ALLOY ELECTROPLATED LAYER ON STEEL SHEETS BY GLOW-DISCHARGE SPECTROMETRY
FURUNUSHI, Y
OHASHI, Y
TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1986, 72 (11): : 1767 - 1774
[5] QUANTITATIVE-ANALYSIS OF ELECTRODEPOSIT ON STEEL BY SECONDARY ION MASS-SPECTROMETRY
SUZUKI, T
OHASHI, Y
TSUNOYAMA, K
TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1986, 72 (11): : 1775 - 1781
[6] IN-DEPTH QUANTITATIVE-ANALYSIS OF ZN-FE ALLOY PLATED LAYER ON STEELS BY GLOW-DISCHARGE SPECTROMETRY
OKANO, T
FURUNUSHI, Y
MATSUMURA, Y
OHASHI, Y
SURFACE AND INTERFACE ANALYSIS, 1986, 9 (1-6) : 388 - 388
[7] QUANTITATIVE-ANALYSIS OF GLASSES AND SILICATES USING SECONDARY ION MASS-SPECTROMETRY
MORGAN, AE
WERNER, HW
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1977, 2 (01): : 88 - 88
[8] QUANTITATIVE-ANALYSIS BY SUB-MICRON SECONDARY ION MASS-SPECTROMETRY
SATOH, H
OWARI, M
NIHEI, Y
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1988, 6 (03): : 915 - 918
[9] QUANTITATIVE-ANALYSIS IN CHEMICALLY DISSIMILAR MATRICES BY SECONDARY ION MASS-SPECTROMETRY
KATZ, W
SMITH, GA
WEI, CY
APPLIED SURFACE SCIENCE, 1983, 15 (1-4) : 247 - 254
[10] QUANTITATIVE-ANALYSIS OF IMPURITIES IN HGCDTE USING SECONDARY ION MASS-SPECTROMETRY
LAPIDES, LE
SURFACE AND INTERFACE ANALYSIS, 1985, 7 (05) : 211 - 216

← 1 2 3 4 5 →