ON THE MECHANISM OF ALUMINUM CORROSION IN METALLIZED FILM AC CAPACITORS

被引：33
|
作者：
TAYLOR, DF
机构：
来源：
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1984年 / 19卷 / 04期
关键词：
D O I：
10.1109/TEI.1984.298801
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：288 / 293
页数：6
相关论文
共 50 条
  • [1] A Proposed R-T Model for Atmospheric Corrosion of Metallized Film in AC Capacitors
    Qiu, Tian
    Li, Hua
    Li, Zheng
    Lin, Fuchang
    Zhang, Guohao
    Wang, Zhehao
    Wang, Yucheng
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2022, 29 (06) : 2258 - 2265
  • [2] Capacitance Loss Mechanism and Prediction Based on Electrochemical Corrosion in Metallized Film Capacitors
    Li, Hua
    Li, Zheng
    Lin, Fuchang
    Chen, Qiren
    Qiu, Tian
    Liu, Yi
    Zhang, Qin
    IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2021, 28 (02) : 661 - 669
  • [3] Accelerated Degradation Testing and Failure Mechanism Analysis of Metallized Film Capacitors for AC Filtering
    Yao, Bo
    Wei, Xing
    Zhang, Yichi
    Correia, Pedro
    Wu, Rui
    Song, Sungyoung
    Trintis, Ionut
    Wang, Haoran
    Wang, Huai
    IEEE TRANSACTIONS ON POWER ELECTRONICS, 2024, 39 (05) : 6256 - 6270
  • [4] ESR Modeling for Atmospheric Corrosion Behavior of Metallized Film Capacitors
    Li, Hua
    Qiu, Tian
    Li, Zheng
    Lin, Fuchang
    Wang, Yan
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2023, 23 (04) : 486 - 493
  • [5] Capacitance Loss Analysis of Metallized Film Capacitors under AC Condition
    Li, Zheng
    Li, Hua
    Lin, Fuchang
    Wang, Zhehao
    Zhang, Guohao
    Qi, Liang
    PROCEEDINGS OF THE 2020 3RD IEEE INTERNATIONAL CONFERENCE ON DIELECTRICS (ICD 2020), 2020, : 173 - 176
  • [6] Ageing metallized polypropylene film capacitors laws confronted with the phenomenon of corrosion
    Rochefort, Claire
    Venet, Pascal
    Clerc, Guy
    Sari, Ali
    Mitova, Radoslava
    Wang, Miao-Xin
    Bevilacqua, Pascal
    Zitouni, Younes
    MICROELECTRONICS RELIABILITY, 2023, 150
  • [7] Failure mechanism of metallized film capacitors under DC field superimposed AC harmonic: From equipment to material
    Li, Zhiyuan
    Zhou, Yihan
    Wang, Xuguang
    Liu, Hongbo
    Cheng, Lu
    Liu, Wenfeng
    Li, Shengtao
    Guo, Jiang
    Xu, Yang
    HIGH VOLTAGE, 2024, 9 (05): : 1081 - 1089
  • [8] Temperature Rise of Metallized Film Capacitors Under AC and DC Superimposed Voltage
    Wang, Zijian
    Lu, Yingjie
    Ma, Yanfeng
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 2021, 49 (12) : 3883 - 3891
  • [9] Novel measurement methods for in-depth analysis of AC metallized film capacitors
    Fuhrmann, H
    Carlen, M
    Chartouni, D
    Christen, T
    Ohler, C
    Votteler, T
    CONFERENCE RECORD OF THE 2004 IEEE INTERNATIONAL SYMPOSIUM ON ELECTRICAL INSULATION, 2004, : 568 - 571
  • [10] Failure mechanism of metallized film pulse capacitors under high electric stress
    Dai, Xin
    Lin, Fuchang
    Li, Jin
    Yao, Zonggan
    Gaodianya Jishu/High Voltage Engineering, 2000, 26 (05): : 27 - 29
12345