EFFECTS OF COINCIDENCES ON THE MEASUREMENT ERROR IN OPTICAL AND ELECTRICAL PARTICLE ANALYZERS

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作者：

OVOD, VI

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来源：

MEASUREMENT TECHNIQUES USSR | 1985年 / 28卷 / 03期

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D O I：

10.1007/BF00861999

中图分类号：

T [工业技术];

学科分类号：

08 ;

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页码：279 / 282

页数：4

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