A REAL-TIME ELECTRON-BEAM TESTING SYSTEM

被引：0
|
作者：
FUJIOKA, H [1 ]
NAKAMAE, K [1 ]
HIROTA, M [1 ]
URA, K [1 ]
TAKASHIMA, S [1 ]
机构：
[1] JEOL LTD, TOKYO 196, JAPAN
来源：
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1989年 / 22卷 / 03期
关键词：
D O I：
10.1088/0022-3735/22/3/001
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：138 / 143
页数：6
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