INSITU RUTHERFORD BACKSCATTERING SPECTROSCOPY FOR ELECTROCHEMICAL INTERPHASE ANALYSIS

被引:16
|
作者
KOTZ, R [1 ]
GOBRECHT, J [1 ]
STUCKI, S [1 ]
PIXLEY, R [1 ]
机构
[1] UNIV ZURICH,INST PHYS,CH-8001 ZURICH,SWITZERLAND
关键词
D O I
10.1016/0013-4686(86)87104-3
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
11
引用
收藏
页码:169 / 172
页数:4
相关论文
共 50 条
  • [1] INSITU SPECTROSCOPY OF THE ELECTROCHEMICAL INTERPHASE
    LEZNA, RO
    DETACCONI, NR
    RAPALLINI, JA
    ARVIA, AJ
    ANALES DE LA ASOCIACION QUIMICA ARGENTINA, 1988, 76 (01): : 25 - 44
  • [2] MONOLAYER ANALYSIS IN RUTHERFORD BACKSCATTERING SPECTROSCOPY
    KIMURA, K
    OHSHIMA, K
    MANNAMI, M
    APPLIED PHYSICS LETTERS, 1994, 64 (17) : 2232 - 2234
  • [3] INSITU RUTHERFORD BACKSCATTERING ANALYSIS OF RADIATION-INDUCED SEGREGATION
    AVERBACK, RS
    REHN, LE
    WAGNER, W
    OKAMOTO, PR
    WIEDERSICH, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 194 (1-3): : 457 - 460
  • [4] RUTHERFORD BACKSCATTERING SPECTROSCOPY (RBS)
    GROB, JJ
    SIFFERT, P
    PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1984, 8 (1-2): : 59 - 106
  • [5] Rutherford backscattering spectroscopy analysis of Au/Cr/GaAs
    Pantelica, D
    Negoita, F
    Ghita, RV
    Cengher, D
    Lazanu, S
    LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1998, 1999, 3578 : 626 - 632
  • [6] Solid-liquid interface analysis with in-situ Rutherford backscattering and electrochemical impedance spectroscopy
    Bergmann, Ute
    Apelt, Sabine
    Khojasteh, Nasrin B.
    Heller, Rene
    SURFACE AND INTERFACE ANALYSIS, 2020, 52 (12) : 1111 - 1116
  • [7] RUTHERFORD BACKSCATTERING ANALYSIS
    PURSER, KH
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1984, 187 (APR): : 38 - INDE
  • [8] MONOLAYER RESOLUTION IN RUTHERFORD BACKSCATTERING SPECTROSCOPY
    KIMURA, K
    OHSHIMA, K
    NAKAJIMA, K
    FUJII, Y
    MANNAMI, M
    GOSSMANN, HJ
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 99 (1-4): : 472 - 475
  • [9] Characterization of Ruthenium Thin Film on Tantalum by Electrochemical Deposition: Rutherford Backscattering Spectroscopy
    Song, Minwu
    Ameen, Sadia
    Kim, Dong-Gyu
    Shin, Hyung-Shik
    Ansari, S. G.
    Kim, Young-Soon
    SCIENCE OF ADVANCED MATERIALS, 2011, 3 (06) : 932 - 938
  • [10] RUTHERFORD BACKSCATTERING SPECTROSCOPY OF INSULATING MATERIALS
    SKELLAND, ND
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1994, 84 (03): : 361 - 367