Defect Root-Cause Analysis and 1+n Procedure technique to improve software quality

被引：0

作者：

Honda, Naomi ^{[1
]}

Yamada, Shigeru ^{[2
]}

机构：

[1] NEC Corp Ltd, IT Software Operat Unit, 1-10 Nisshin Cho, Fuchu, Tokyo 1838501, Japan

[2] Tottori Univ, Grad Sch Engn, Dept Social Management Engn, Tottori 6808552, Japan

来源：

INTERNATIONAL JOURNAL OF SYSTEM ASSURANCE ENGINEERING AND MANAGEMENT | 2012年 / 3卷 / 02期

关键词：

Defect Root-Cause Analysis; 1+n procedure; Why-why analysis; Quality management; Quality improvement; Quality Accounting;

D O I：

10.1007/s13198-012-0118-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A "Defect Root-Cause Analysis and 1+n Procedure" is a technique designed to analyze specific root-causes of a software defect and detect defects of the same kind which are introduced due to the same root-cause and overlooked during the software design review and testing. This paper describes the "Defect Root-Cause Analysis and 1+n Procedure" technique in detail and reports a method of its application, real world example, and its contribution to software quality improvement. The characteristics of the "Defect Root-Cause Analysis and 1+n Procedure" technique is also discussed.

引用

页码：111 / 121

页数：11

共 28 条

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