INDIRECT PROCESSES IN THE STANDING X-RAY WAVE METHOD

被引：0
|
作者：
AFANASYEV, AM
IMAMOV, RM
MASLOV, AV
MUKHAMEDZHANOV, EK
PASHAEV, EM
PEREGUDOV, VN
机构：
来源：
KRISTALLOGRAFIYA | 1991年 / 36卷 / 02期
关键词：
D O I：
暂无
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
引用
收藏
页码：513 / 528
页数：16
相关论文
共 50 条
  • [1] ON THE EXTREME RESOURCES OF THE X-RAY STANDING WAVE METHOD
    AFANASIEV, AM
    PEREGUDOV, VN
    DOKLADY AKADEMII NAUK SSSR, 1988, 301 (05): : 1098 - 1100
  • [2] Double-crystal X-ray diffractometry in the role of X-ray standing-wave method
    A. M. Afanas’ev
    M. A. Chuev
    R. M. Imamov
    É. M. Pashaev
    S. N. Yakunin
    J. Horvat
    Journal of Experimental and Theoretical Physics Letters, 2001, 74 : 498 - 501
  • [3] Double-crystal X-ray diffractometry in the role of X-ray standing-wave method
    Afanas'ev, AM
    Chuev, MA
    Imamov, RM
    Pashaev, ÉM
    Yakunin, SN
    Horvat, J
    JETP LETTERS, 2001, 74 (10) : 498 - 501
  • [4] Structural analysis of bismuth nanowire by X-ray standing wave method
    Saito, A
    Matoba, K
    Kurata, T
    Maruyama, J
    Kuwahara, Y
    Miki, K
    Aono, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2003, 42 (4B): : 2408 - 2411
  • [5] Structural analysis of bismuth nanowire by X-ray standing wave method
    Saito, A., 1600, Japan Society of Applied Physics (42):
  • [6] MULTIPLE DIFFRACTION IN X-RAY STANDING WAVE METHOD - PHOTOEMISSION MEASUREMENTS
    KAZIMIROV, AY
    KOVALCHUK, MV
    KOHN, VG
    KHARITONOV, IY
    SAMOILOVA, LV
    ISHIKAWA, T
    KIKUTA, S
    HIRANO, K
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1993, 135 (02): : 507 - 512
  • [7] DETERMINATION OF CRYSTALLOGRAPHIC POLARITY OF CDTE BY THE STANDING X-RAY WAVE METHOD
    ZAKHAROV, BG
    KAZIMIROV, AY
    KON, VG
    SOZONTOV, EA
    SOSFENOV, AN
    PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1989, 15 (22): : 31 - 35
  • [8] Application of x-ray excited optical luminescence to x-ray standing wave method and atomic resolution holography
    Hayashi, Kouichi
    Hayashi, Tetsutaro
    Shishido, Toetsu
    Matsubara, Eiichiro
    Makino, Hisao
    Yao, Takafumi
    Matsushita, Tomohiro
    PHYSICAL REVIEW B, 2007, 76 (01):
  • [9] Polarity determination of GaN thin films by X-ray standing wave method
    Yasoshima, T
    Koyama, T
    Akimoto, K
    Ichimiya, A
    Sasaoka, C
    Usui, A
    BLUE LASER AND LIGHT EMITTING DIODES II, 1998, : 620 - 623
  • [10] Program for calculating the scattering parameters used in the X-ray standing wave method
    V. G. Kohn
    Crystallography Reports, 2006, 51 : 936 - 940
12345