CHARACTERIZATION OF DEFECTS FORMED IN AMORPHOUS SIO2 BY HIGH-ENERGY IONS USING ELECTRON-SPIN RESONANCE AND OPTICAL SPECTROSCOPY

被引：12
|
作者：
DOORYHEE, E
LANGEVIN, Y
BORG, J
DURAUD, JP
BALANZAT, E
机构：
[1] CENS,DEPT PHYSICOCHIM,F-91191 GIF SUR YVETTE,FRANCE
[2] CIRIL,F-14040 CAEN,FRANCE
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1988年 / 32卷 / 1-4期
关键词：
D O I：
10.1016/0168-583X(88)90220-0
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：264 / 267
页数：4
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