CHARACTERISTICS OF A SPUTTERED Y-BA-CU-O THIN-FILM DC SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE PREPARED BY RF-SPUTTERING

被引：3
|
作者：
GOTO, T
YING, XB
PARK, CH
TAKEDA, Y
USAMI, K
KOBAYASHI, T
机构：
[1] Department of Communications and Systems, University of Electro-Communications, Chofu, Tokyo 182
来源：
JOURNAL OF APPLIED PHYSICS | 1991年 / 70卷 / 03期
关键词：
D O I：
10.1063/1.349505
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A dc superconducting quantum interference device (SQUID) is fabricated on an amorphous Y-Ba-Cu-O film by a photolithographic technique and successive post-annealing treatment. The SQUID shows periodic and symmetric behavior in the voltage versus magnetic-flux curves (V-PHI curves). No multiple periodicities are observed. The transfer function partial-V/partial-PHI for output voltage is about 90 20-mu-V/PHI-0 at 4.2 and 56 K, respectively. It is expected that the SQUID contains only two symmetric active Josephson junctions.
引用
收藏
页码：1856 / 1857
页数：2
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