ON THE ABERRATIONS OF UNIFORM-FIELDS

In some recent publications [1, 2] we presented the results of some calculations on the aberration properties of combinations of uniform magnetic and electrostatic fields. These results indicated that it should be possible to use such combinations for the correction of the spherical and chromatic aberrations in electron microscopes. In the present paper we extend these calculations to cover the complete spectrum of possible combinations of fields and we use a different method for the determination of the aberrations. These results confirm the previous ones and provide further possible opportunities for the use of these systems.