AN ANALYSIS OF ANGULAR DEPENDENT XPS PEAK INTENSITIES

被引：30
|
作者：
ARMSTRONG, RA [1 ]
EGELHOFF, WF [1 ]
机构：
[1] NBS,DIV SURFACE SCI,GAITHERSBURG,MD 20899
来源：
SURFACE SCIENCE | 1985年 / 154卷 / 2-3期
关键词：
D O I：
10.1016/0039-6028(85)90031-7
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
引用
收藏
页码：L225 / L232
页数：8
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