CORRELATION BETWEEN LIGHT AND CURRENT-INDUCED DEGRADATION IN A-SI SOLAR-CELLS

被引：1

作者：

YANAGISAWA, T

机构：

[1] Electrotechnical Laboratory, Ibaraki 305

来源：

ELECTRONICS LETTERS | 1994年 / 30卷 / 21期

关键词：

AMORPHOUS SEMICONDUCTORS; SILICON; SOLAR CELLS; LIFE TESTING; RELIABILITY;

D O I：

10.1049/el:19941176

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Long-term degradation tests were carried out on amorphous silicon solar cells by light irradiation and current injection. The correlation of the degradation patterns and the lifetime estimation data in these two methods have confirmed the mutual stress conversion of light and current intensity. It is possible to estimate the lifetime of solar cells.

引用

页码：1802 / 1803

页数：2

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