ION-BEAM STUDIES OF H AND HE IN METALS

被引：46

作者：

PICRAUX, ST ^{[1
]}

VOOK, FL ^{[1
]}

机构：

[1] SANDIA LABS,ALBUQUERQUE,NM 87115

来源：

JOURNAL OF NUCLEAR MATERIALS | 1974年 / 53卷 / 01期

关键词：

D O I：

10.1016/0022-3115(74)90251-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：246 / 251

页数：6

共 10 条

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[2]

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[3] DEPTH DISTRIBUTION OF IMPLANTED HELIUM AND OTHER LOW-Z ELEMENTS IN METAL-FILMS USING PROTON BACKSCATTERING [J].

BLEWER, RS .

APPLIED PHYSICS LETTERS, 1973, 23 (11) :593-595

[4]

BLEWER RS, 1974, APPLICATIONS ION BEA

[5]

Erents S. K., 1973, Radiation Effects, V18, P191, DOI 10.1080/00337577308232121

[6] DEPTH DISTRIBUTION PROFILING OF DEUTERIUM AND HE-3 [J].

LANGLEY, RA ;

PICRAUX, ST ;

VOOK, FL .

JOURNAL OF NUCLEAR MATERIALS, 1974, 53 (01) :257-261

[7]

PICRAUX ST, 1974, APPLICATIONS ION BEA

[8] DEPTH PROFILING OF HE-3 AND H-2 IN SOLIDS USING HE-3(D,P)HE-4 RESONANCE [J].

PRONKO, PP ;

PRONKO, JG .

PHYSICAL REVIEW B, 1974, 9 (07) :2870-2878

[9] BLISTERING OF NIOBIUM DUE TO 0.5 TO 9 KEV HELIUM AND HYDROGEN BOMBARDMENT [J].

ROTH, J ;

BEHRISCH, R ;

SCHERZER, BM .

JOURNAL OF NUCLEAR MATERIALS, 1974, 53 (01) :147-153

[10]

TAYLOR A, 1973, AM NUCL SOC T, V16, P82

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