共 50 条
- [1] MODULATED OPTICAL REFLECTANCE MEASUREMENTS ON AMORPHOUS-SILICON LAYERS AND DETECTION OF RESIDUAL DEFECTS APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1988, 47 (02): : 147 - 155
- [3] Laser modulated optical reflectance of thin semiconductor films on glass REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (01): : 873 - 876
- [5] The optical characterization of thin layers by spectrophotometry measurements 2003 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2003, : 87 - 90
- [6] Modulated optical reflectance NDE of superconducting thin film microwave devices REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 19A AND 19B, 2000, 509 : 627 - 633