SURFACE CRACKING IN GOLD-SILICON ALLOYS

被引：3
|
作者：
JOHNSON, DN
JOHNSON, AA
机构：
来源：
SOLID-STATE ELECTRONICS | 1984年 / 27卷 / 12期
关键词：
D O I：
10.1016/0038-1101(84)90050-9
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：1107 / &
相关论文
共 50 条
  • [1] PHASE TRANSFORMATIONS IN GOLD-SILICON ALLOYS
    PHILOFSK.EM
    RAVI, KV
    BROOKS, JA
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1970, 117 (08) : C262 - &
  • [2] ELECTRICAL-RESISTIVITY OF LIQUID GOLD-SILICON ALLOYS
    HAUSER, E
    RAY, S
    TAUC, J
    SOLID STATE COMMUNICATIONS, 1979, 29 (12) : 821 - 823
  • [3] NEW RESULTS ON GOLD-SILICON SURFACE BARRIER
    GORADIA, CP
    REYNOLDS, J
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1968, NS15 (03) : 281 - +
  • [4] ELECTRICAL-RESISTIVITY OF LIQUID GOLD-SILICON ALLOYS
    HAUSER, E
    RAY, S
    TAUC, J
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 359 - 359
  • [5] OPTICAL-PROPERTIES OF AMORPHOUS METALLIC GOLD-SILICON ALLOYS
    HAUSER, E
    ZIRKE, RJ
    TAUC, J
    HAUSER, JJ
    NAGEL, SR
    PHYSICAL REVIEW B, 1979, 19 (12): : 6331 - 6336
  • [6] A composite gold-silicon oxide surface for mesoscopic patterning
    Shabtai, K
    Cohen, SR
    Cohen, H
    Rubinstein, I
    JOURNAL OF PHYSICAL CHEMISTRY B, 2003, 107 (23): : 5540 - 5546
  • [7] NON-CRYSTALLINE STRUCTURE IN SOLIDIFIED GOLD-SILICON ALLOYS
    KLEMENT, W
    WILLENS, RH
    DUWEZ, P
    NATURE, 1960, 187 (4740) : 869 - 870
  • [8] EFFECT OF COOLING RATE ON SOLIDIFICATION MICROSTRUCTURES OF GOLD-RICH GOLD-SILICON ALLOYS
    HORYLEV, RJ
    ANANTATM.RP
    GUPTA, SP
    JOHNSON, AA
    JOURNAL OF ELECTRONIC MATERIALS, 1974, 3 (04) : 860 - 860
  • [9] PHASE-TRANSFORMATIONS IN EUTECTIC GOLD-SILICON ALLOYS ON SINGLE-CRYSTAL SILICON
    PHILOFSK.E
    BROOKS, J
    HALL, E
    RAVI, KV
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1972, 119 (04) : 527 - &
  • [10] NUCLEAR MICROANALYSIS STUDY OF SURFACE NANOLAYERS IN GOLD-SILICON STRUCTURES
    Soroka, V. I.
    Lebed, S. O.
    Tolmachov, M. G.
    Kukharenko, O. G.
    Veselov, O. O.
    UKRAINIAN JOURNAL OF PHYSICS, 2013, 58 (04): : 311 - 317
12345