COMPOSITION DEPENDENCE OF BREMSSTRAHLUNG BACKGROUND IN ELECTRON-PROBE X-RAY-MICROANALYSIS

被引：48

作者：

MARKOWICZ, AA ^{[1
]}

VANGRIEKEN, RE ^{[1
]}

机构：

[1] UNIV INSTELLING ANTWERP,DEPT CHEM,B-2610 WILRIJK,BELGIUM

来源：

ANALYTICAL CHEMISTRY | 1984年 / 56卷 / 12期

关键词：

D O I：

10.1021/ac00276a016

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：2049 / 2051

页数：3

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