CHEMICAL-DEPENDENCE OF THE MULTIPLE-TIP EFFECT IN SCANNING TUNNELING MICROSCOPY

被引：10
|
作者：
PARK, SI
NOGAMI, J
MIZES, HA
QUATE, CF
机构：
来源：
PHYSICAL REVIEW B | 1988年 / 38卷 / 06期
关键词：
D O I：
10.1103/PhysRevB.38.4269
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：4269 / 4272
页数：4
相关论文
共 50 条
  • [1] MULTIPLE-TIP EFFECT ON SCANNING TUNNELING MICROSCOPE IMAGES OF DEOXYRIBONUCLEIC-ACID
    HU, J
    GU, M
    WANG, Z
    YAO, X
    XU, Y
    ZHANG, L
    HUANG, Z
    ZHU, J
    LI, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (01): : 110 - 113
  • [2] MULTIPLE-TIP INTERPRETATION OF ANOMALOUS SCANNING-TUNNELING-MICROSCOPY IMAGES OF LAYERED MATERIALS
    MIZES, HA
    PARK, S
    HARRISON, WA
    PHYSICAL REVIEW B, 1987, 36 (08): : 4491 - 4494
  • [3] Removal of multiple-tip artifacts from scanning tunneling microscope images by crystallographic averaging
    Straton, Jack C.
    Moon, Bill
    Bilyeu, Taylor T.
    Moeck, Peter
    ADVANCED STRUCTURAL AND CHEMICAL IMAGING, 2015, 1
  • [4] EFFECT OF TIP MORPHOLOGY ON IMAGES OBTAINED BY SCANNING TUNNELING MICROSCOPY
    PARK, SI
    NOGAMI, J
    QUATE, CF
    PHYSICAL REVIEW B, 1987, 36 (05): : 2863 - 2866
  • [5] Carbon nanotube tip for scanning tunneling microscopy
    Shingaya, Y
    Nakayama, T
    Aono, M
    PHYSICA B-CONDENSED MATTER, 2002, 323 (1-4) : 153 - 155
  • [6] ROLE OF TIP STRUCTURE IN SCANNING TUNNELING MICROSCOPY
    KUK, Y
    SILVERMAN, PJ
    APPLIED PHYSICS LETTERS, 1986, 48 (23) : 1597 - 1599
  • [7] EVIDENCE FOR TIP IMAGING IN SCANNING TUNNELING MICROSCOPY
    VANLOENEN, EJ
    DIJKKAMP, D
    HOEVEN, AJ
    LENSSINCK, JM
    DIELEMAN, J
    APPLIED PHYSICS LETTERS, 1990, 56 (18) : 1755 - 1757
  • [8] FABRICATION OF THE TIP FOR ELECTROCHEMICAL SCANNING TUNNELING MICROSCOPY
    Zhen Fang CHEN Er Kang WANG~* Laboratory of Electroanalytical Chemistry
    ChineseChemicalLetters, 1992, (10) : 845 - 848
  • [9] TIP STRUCTURE DETERMINATION BY SCANNING TUNNELING MICROSCOPY
    VANDEWALLE, GFA
    VANKEMPEN, H
    WYDER, P
    SURFACE SCIENCE, 1986, 167 (2-3) : L219 - L224
  • [10] EFFECT OF THE MICROSCOPIC ELECTRONIC STATES OF THE TIP ON THE SCANNING TUNNELING MICROSCOPY IMAGE
    OHNISHI, S
    TSUKADA, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (01): : 174 - 176
12345