EMPIRICAL DETERMINATION OF THE NOISE-FIGURE OF GAAS-MESFETS

被引：0

|

作者：

AHMED, MK

机构：

来源：

FREQUENZ | 1984年 / 38卷 / 12期

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：313 / 317

页数：5

相关论文

共 50 条

[1] OPTIMAL NOISE-FIGURE OF MICROWAVE GAAS-MESFETS
FUKUI, H
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (07) : 1032 - 1037
[2] DESIGN CENTERING FOR YIELD AND NOISE-FIGURE IMPROVEMENT OF GAAS-MESFETS
LEE, SB
TCHAH, KH
IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS, 1991, 138 (04): : 467 - 473
[3] A MONTE-CARLO PARTICLE STUDY OF THE INTRINSIC NOISE-FIGURE IN GAAS-MESFETS
MOGLESTUE, C
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1985, 4 (04) : 536 - 540
[4] NOISE-FIGURE OF MESFETS
BREWITTTAYLOR, CR
ROBSON, PN
SITCH, JE
IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION, 1980, 127 (01): : 1 - 8
[5] EXPRESSION FOR THE OPTIMUM NOISE-FIGURE OF MICROWAVE MESFETS
JAVAN, H
ROSENBAUM, FJ
GOLDWASSER, RE
INTERNATIONAL JOURNAL OF ELECTRONICS, 1985, 58 (02) : 315 - 320
[6] THE EFFECTS OF PARASITIC CAPACITANCE ON THE NOISE-FIGURE OF MESFETS
TEHRANI, S
NAIR, V
WEITZEL, CE
TAM, G
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (05) : 703 - 706
[7] MICROWAVE NOISE CHARACTERIZATION OF GAAS-MESFETS - DETERMINATION OF EXTRINSIC NOISE PARAMETERS
GUPTA, MS
GREILING, PT
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1988, 36 (04) : 745 - 751
[8] THERMAL NOISE MEASUREMENTS IN GAAS-MESFETS
FOLKES, PA
IEEE ELECTRON DEVICE LETTERS, 1985, 6 (12) : 620 - 622
[9] OPTIMUM BIAS FOR THE OPTIMUM NOISE-FIGURE OF MICROWAVE MESFETS
JAVAN, H
ROSENBAUM, FJ
GOLDWASSER, RE
INTERNATIONAL JOURNAL OF ELECTRONICS, 1986, 60 (03) : 417 - 420
[10] NOISE CAUSED BY GAAS-MESFETS IN OPTICAL RECEIVERS
OGAWA, K
BELL SYSTEM TECHNICAL JOURNAL, 1981, 60 (06): : 923 - 928

← 1 2 3 4 5 →