ANALYSIS OF CONVECTIVE MASS-TRANSFER BY POTENTIAL RELAXATION .2. TRANSIENT NATURAL-CONVECTION COPPER DEPOSITION

被引:5
|
作者
VOHRA, M [1 ]
PINTAURO, PN [1 ]
机构
[1] TULANE UNIV,DEPT CHEM ENGN,NEW ORLEANS,LA 70118
关键词
D O I
10.1149/1.2086349
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
A transient potential relaxation technique was used to determine mass transfer boundary-layer thicknesses during steady-state and pre-steady-state natural convection copper deposition at a vertical flat plate cathode. Boundary-layer thicknesses for constant currents below the limiting current and pulsed currents at 6 Hz were found by matching experimentally measured concentration overpotentials after current interruption to a theoretical surface concentration decay model. The initial growth of constant and pulsed current boundary-layers with the time of current passage was found to be diffusion controlled. Steady-state pulsed current boundary-layer thicknesses were approximately 33% smaller than those obtained from constant current experiments. © 1990, The Electrochemical Society, Inc. All rights reserved.
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页码:141 / 148
页数:8
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