HOLOGRAPHIC STUDY OF NON DESTRUCTIVE THERMAL-STRESS IN MULTIDIELECTRIC FILMS COATED FOR 10,6 MU-M

被引：0

作者：

BAULAIGUE, P ^{[1
]}

AUBERT, D ^{[1
]}

BLANCHER, H ^{[1
]}

OCCELLI, R ^{[1
]}

MOYNAULT, JM ^{[1
]}

机构：

[1] FAC SCI & TECH ST JEROME,F-13397 MARSEILLE 20,FRANCE

来源：

JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE | 1994年 / 25卷 / 06期

关键词：

LASER DAMAGE; OPTICAL MATERIAL; STRESS;

D O I：

10.1088/0150-536X/25/6/001

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We have developed a interferometric method, using holography, so that a thermal stress of a multidielectric coating deposited on glass subject to continuous laser flow at CO2 power can be observed in real time. This method is used with an image acquisition system so that computer processing of the observed fringes is possible.

引用

页码：225 / 229

页数：5

共 3 条

[1] STUDY OF REFLECTANCE OF SEA-WATER AND SOME WATER SOLUTIONS FOR WAVELENGTH OF 10,6 MU-M
KROPOTKIN, MA
SHEVELEVA, TY
IZVESTIYA AKADEMII NAUK SSSR FIZIKA ATMOSFERY I OKEANA, 1975, 11 (02): : 211 - 214
[2] AMPLIFICATION OF 10,6 MU-M SIGNAL IN WAVE-GUIDE DISCHARGE-TUBES
KUZYAKOV, BA
KHORKOV, VF
IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII RADIOELEKTRONIKA, 1980, 23 (11): : 3 - 7
[3] STUDY OF AsxSe1 - x FILMS FOR USE IN INTEGRATED OPTICS AT 10. 6 mu m.
Anikin, V.I.
Olevskii, S.S.
Terichev, V.F.
Journal of applied spectroscopy, 1984, 41 (02): : 927 - 929

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