共 50 条
- [1] NONINTRUSIVE POSITION MEASUREMENT OF MAGNETICALLY SCANNED ION-BEAMS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1989, 37-8 : 552 - 554
- [6] A TECHNIQUE FOR SIMULATING ELECTROSTATICALLY SCANNED ION-BEAMS TO DETERMINE IMPLANT UNIFORMITY PROCEEDINGS OF THE 1989 SUMMER COMPUTER SIMULATION CONFERENCE, 1989, : 266 - 271
- [7] CHOPPED ION-BEAMS FOR RADIATION EFFECTS SIMULATION NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 9 (01): : 100 - 102
- [8] PRODUCTION OF INTENSE FOCUSED ION-BEAMS USING MAGNETICALLY INSULATED DIODES BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1976, 21 (09): : 1077 - 1077
- [9] EXTRACTION AND FOCUSING OF INTENSE ION-BEAMS FROM A MAGNETICALLY INSULATED DIODE BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1976, 21 (04): : 691 - 691