共 50 条
- [1] A MULTIPOINT CORRELATION METHOD FOR BULK TRAP AND INTERFACE STATE MEASUREMENTS IN MOS STRUCTURES FROM CAPACITANCE, VOLTAGE, AND CURRENT TRANSIENTS REVIEW OF SCIENTIFIC INSTRUMENTS, 1991, 62 (08): : 1955 - 1963
- [2] A METHOD OF DETERMINATION OF THE TRAP DEPTH OF DEEP CENTERS BY CAPACITANCE MEASUREMENTS PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1985, 89 (02): : K197 - K200
- [4] A comparison of free carrier absorption and capacitance voltage methods for interface trap measurements SILICON CARBIDE AND RELATED MATERIALS 2012, 2013, 740-742 : 465 - +