FABRICATION AND OPTICAL CHARACTERIZATION OF QUANTUM WIRES FROM SEMICONDUCTOR-MATERIALS WITH VARYING IN CONTENT

被引：38
|
作者：
MAILE, BE
FORCHEL, A
GERMANN, R
GRUTZMACHER, D
MEIER, HP
REITHMAIER, JP
机构：
[1] RHEIN WESTFAL TH AACHEN,INST HALBLEITERTECH,W-5100 AACHEN,GERMANY
[2] IBM CORP,DIV RES,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND
[3] SIEMENS AG,RES LABS,W-8000 MUNICH 83,GERMANY
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1989年 / 7卷 / 06期
关键词：
D O I：
10.1116/1.584642
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：2030 / 2033
页数：4
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