Current spreading in proton-implanted vertical-cavity top-surface-emitting

被引:0
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作者
Nakwaski, W [1 ]
Osinski, M [1 ]
机构
[1] TECH UNIV LODZ, INST PHYS, PL-93005 LODZ, POLAND
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the paper, the current spreading phenomenon is analysed in proton-implanted vertical-cavity top-surface-emitting lasers (VCSELs). A simple approximation analytical relation was derived for a radial distribution of the current density entering the active regions of these lasers. This distribution is nearly uniform in the case VCSELs with a very small active region of radius R(A) less than or similar to 2 mu m but becomes more and more non-uniform with an increase in the active region's size. In VCSELs with very large active regions (r(A) greater than or similar to 10 mu m), most current flows within a narrow annular area close to the active-region perimeter. This non-uniformity should be taken into account in modelling all physical phenomena in VCSEL structures that are influenced by distributions of a current density or a carrier concentration within their active regions.
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页码:119 / 127
页数:9
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