PROD - A VLSI FAULT-DIAGNOSIS SYSTEM

被引：3

|

作者：

ODRYNA, P ^{[1
]}

STROJWAS, AJ ^{[1
]}

机构：

[1] CARNEGIE MELLON UNIV,SRC CMU CTR COMP AIDED DESIGN,DEPT ELECT & COMP ENGN,PITTSBURGH,PA 15213

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1985年 / 2卷 / 06期

关键词：

D O I：

10.1109/MDT.1985.294794

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

收藏

页码：27 / 35

页数：9

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