INELASTIC LOSSES OF LOW-ENERGY IONS TRANSMITTED THROUGH THIN-FILMS

被引：8

作者：

MIKHEEV, S ^{[1
]}

RYZHOV, Y ^{[1
]}

SHKARBAN, I ^{[1
]}

YURASOVA, V ^{[1
]}

机构：

[1] MOSCOW MV LOMONOSOV STATE UNIV, DEPT PHYS, MOSCOW 117234, RUSSIA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1993年 / 78卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(93)95782-Z

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Experimental results on inelastic losses by ions of energy 10(3)-10(4) eV transmitted through thin solid films are presented and discussed. The C, Cu, Ag, and Ni films (from 35 to 900 angstrom thick) have been bombarded by He+, Ne+ and Ar+ ions. The angular and temperature dependence of energy losses of transmitted ions have been studied. Experimentally obtained values of inelastic losses appear to agree with the Lindhard-Scharff-Schott (LSS) theory. A step-like increase in inelastic energy losses has been observed for He+ ions transmitted through the Ni films undergoing ferro- to paramagnetic phase transition.

引用

页码：86 / 90

页数：5

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