DETERMINATION OF DOPANT AND DEEP IMPERFECTION PROFILES IN P-TYPE CDTE BY IMPROVED CONSTANT CAPACITANCE-VOLTAGE TRANSIENT MEASUREMENTS

被引:13
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SHIAU, JJ
FAHRENBRUCH, AL
BUBE, RH
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10.1063/1.338113
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O59 [应用物理学];
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页码:1340 / 1347
页数:8
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