共 22 条
- [1] TARGET BACKINGS FOR CHARGED-PARTICLE INDUCED X-RAY-FLUORESCENCE ANALYSIS NUCLEAR INSTRUMENTS & METHODS, 1973, 109 (03): : 429 - 437
- [2] TRACE-ELEMENT ANALYSIS OF WATER USING CHARGED-PARTICLE INDUCED X-RAYS BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1975, 20 (02): : 226 - 226
- [3] TRACE-ELEMENT ANALYSIS IN THICK TARGETS BY CHARGED-PARTICLE INDUCED X-RAYS NUCLEAR INSTRUMENTS & METHODS, 1975, 131 (03): : 503 - 509
- [4] CHARGED-PARTICLE INDUCED X-RAY ANALYSIS OF DRINKING-WATER BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1975, 20 (04): : 685 - 685
- [5] CHARGED-PARTICLE INDUCED X-RAY ANALYSIS OF LUBRICATING OIL SAMPLES BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1975, 20 (04): : 685 - 685
- [6] CHARGED-PARTICLE INDUCED DELAYED X-RAYS (DEX) FOR THE ANALYSIS OF INTERMEDIATE AND HEAVY-ELEMENTS NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 35 (3-4): : 555 - 560
- [7] TARGET CHAMBER FOR CHARGED-PARTICLE INDUCED X-RAY-FLUORESCENCE STUDIES NUCLEAR INSTRUMENTS & METHODS, 1972, 103 (02): : 341 - &
- [8] CHARGED-PARTICLE INDUCED X-RAY ANALYSIS OF MALARIA INFECTED BLOOD SAMPLES BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1975, 20 (02): : 226 - 226
- [9] X-ray shielding of an ionizer using low-energy X-rays below 9.5 keV for ultra-clean assembly line of electronic devices JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (7A): : 4878 - 4885
- [10] X-ray shielding of an ionizer using low-energy X-rays below 9.5 keV for ultra-clean assembly line of electronic devices Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2005, 44 (7 A): : 4878 - 4885