ANGLE-RESOLVED SECONDARY-ELECTRON-EMISSION SPECTRA FROM SI(111)7BY7 SURFACE STATES

被引：33
作者：
BEST, PE
机构：
[1] UNIV CONNETICUT,INST MAT SCI,STORRS,CT 06268
[2] UNIV CONNECTICUT,DEPT PHYS,STORRS,CT 06268
来源：
PHYSICAL REVIEW LETTERS | 1975年 / 34卷 / 11期
关键词：
D O I：
10.1103/PhysRevLett.34.674
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：674 / 677
页数：4
相关论文
共 15 条
[1]   FINE STRUCTURE MEASUREMENTS IN ENERGY ANGULAR DISTRIBUTION OF SECONDARY ELECTRONS FROM A (110) FACE OF COPPER [J].
APPELT, G .
PHYSICA STATUS SOLIDI, 1968, 27 (02) :657-&
[2]  
APPLEBAUM JA, 1973, PHYS REV LETT, V31, P106
[3]  
BEST PE, 1969, B AM PHYS SOC, V14, P794
[4]  
BORTOLANI V, 1973, J PHYS C, V6, pK349
[5]   ANGULAR DISTRIBUTION OF SECONDARY ELECTRONS FROM (100) FACES OF COPPER AND NICKEL [J].
BURNS, J .
PHYSICAL REVIEW, 1960, 119 (01) :102-114
[6]   CONTAMINANTS ON CHEMICALLY ETCHED SILICON SURFACES - LEED-AUGER METHOD [J].
CHANG, CC .
SURFACE SCIENCE, 1970, 23 (02) :283-&
[7]  
ERBADAK M, 1972, PHYS REV LETT, V29, P732
[8]   STRUCTURE AND TRANSFORMATION CHARACTERISTICS OF IMPURITY STABILIZED PHASES ON SI(111) SURFACE [J].
FLORIO, JV ;
ROBERTSON, WD .
SURFACE SCIENCE, 1971, 24 (01) :173-+
[9]  
Hachenberg O., 1959, ADVAN ELECTRON ELECT, V11, P413
[10]  
Jonker J L H, 1957, PHILIPS RES REP, V12, P249
12