BONDING STUDY OF TIC AND TIN .1. HIGH-PRECISION X-RAY-DIFFRACTION DETERMINATION OF THE VALENCE-ELECTRON DENSITY DISTRIBUTION, DEBYE-WALLER TEMPERATURE FACTORS, AND ATOMIC STATIC DISPLACEMENTS IN TIC0.94 AND TIN0.99

被引：137
作者：
DUNAND, A
FLACK, HD
YVON, K
机构：
来源：
PHYSICAL REVIEW B | 1985年 / 31卷 / 04期
关键词：
D O I：
10.1103/PhysRevB.31.2299
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：2299 / 2315
页数：17
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