SMALL GEOMETRY MOS-TRANSISTOR CAPACITANCE MEASUREMENT METHOD USING SIMPLE ON-CHIP CIRCUITS - REPLY

被引：0

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作者：

ORISIAN, JE

IWAI, H

WALKER, JT

DUTTON, RW

机构：

来源：

IEEE ELECTRON DEVICE LETTERS | 1985年 / 6卷 / 01期

关键词：

D O I：

10.1109/EDL.1985.26043

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：64 / 67

页数：4

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