CHARACTERIZATION OF A METAL-CLAD ANISOTROPIC THIN-FILM BY THE GUIDED-WAVE METHOD

被引：0
|
作者：
WANG, HM
机构：
[1] Centro de Investigaciones en Optica, A.C, Leon, GTO, 37000, Apartado Postal 948, Loma del Pocito s/n, Col. Lomas del Campestre
来源：
JOURNAL OF MODERN OPTICS | 1994年 / 41卷 / 10期
关键词：
D O I：
10.1080/09500349414551881
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We have studied the propagation of plane waves in anisotropic and absorbing films. The Goos-Hanchen shifts at interfaces of film/metallic overlayer and film/substrate as well as the transverse phase shift of the plane wave travelling in the films have been determined. Based on these studies, the refractive indices and thicknesses of films have been recovered from theoretical analyses and experimental investigations on the mode dispersion equation of guided waves in the films.
引用
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页码：1995 / 2006
页数：12
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