ANGLE-RESOLVED PHOTOEMISSION FROM EPITAXIAL ND2-XCEXCUO4(001) FILMS

被引:13
|
作者
SAKISAKA, Y
MARUYAMA, T
MORIKAWA, Y
KATO, H
EDAMOTO, K
OKUSAWA, M
AIURA, Y
YANASHIMA, H
TERASHIMA, T
BANDO, Y
IIJIMA, K
YAMAMOTO, K
HIRATA, K
机构
[1] RES INST PROD DEV,KYOTO 606,JAPAN
[2] NATL LAB HIGH ENERGY PHYS,PHOTON FACTORY,TSUKUBA,IBARAKI 305,JAPAN
[3] UNIV TSUKUBA,INST PHYS,SAKURA,IBARAKI 305,JAPAN
[4] KYOTO UNIV,INST CHEM RES,UJI,KYOTO 611,JAPAN
[5] TOKYO INST TECHNOL,FAC SCI,DEPT CHEM,TOKYO 152,JAPAN
[6] UNIV OSAKA PREFECTURE,COLL ENGN,SAKAI,OSAKA 591,JAPAN
关键词
D O I
10.1016/0038-1098(90)90685-5
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Angle-resolved photoemission results from Nd2-xCexCuO4 (001) single-crystal thin films are reported. The valence-band spectra show a resolution-limited Fermi edge and can be compared to the band calculation to a fair degree, though the main peaks exhibits less well defined dispersion of less than 0.4 eV. A bandlike state of dominant C u 3d character is found just below the Fermi level. It shows well-defined but small dispersion of ∼0.2 eV. There is a possibility of Kondo-type renormalized heavy-electron band formation at the Fermi level. © 1990.
引用
收藏
页码:609 / 611
页数:3
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