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- [1] MEASUREMENT OF CORRELATION BETWEEN SPECULAR REFLECTANCE AND SURFACE-ROUGHNESS OF AG FILMSPHYSICAL REVIEW B, 1976, 14 (02): : 479 - 483CUNNINGHAM, LJBRAUDMEIER, AJ
- [2] OPTICAL EVALUATION OF SURFACE-ROUGHNESS OF SILICON EPITAXIAL LAYERS ON SAPPHIREJOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (08) : C341 - C341FABICK, LBBERGER, J
- [3] EVALUATION OF SURFACE-ROUGHNESS OF SILICON-ON-SAPPHIRE AND POLYSILICON BY UV SPECTROPHOTOMETRYJOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (11) : C455 - C455CHIANG, KLDELLOCA, CJSCHWETTMANN, FN
- [4] INFLUENCE OF FRACTAL SURFACE-ROUGHNESS ON REFLECTANCEOPTICA APPLICATA, 1989, 19 (01) : 113 - 118LATKA, MJEZIERSKI, K
- [5] DETERMINATION OF SURFACE ROUGHNESS FROM MEASUREMENTS OF SPECULAR REFLECTANCEJOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (05) : 504 - 505BENNETT, HEPORTEUS, JO
- [6] A METHOD FOR SURFACE-ROUGHNESS MEASUREMENT BY MEANS OF LIGHT REFLECTANCEBULLETIN OF THE JAPAN SOCIETY OF PRECISION ENGINEERING, 1982, 16 (02): : 123 - 124SAKAI, ISAWABE, M
- [7] OPTICAL EVALUATION OF POLYCRYSTALLINE SILICON SURFACE-ROUGHNESSJOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (12) : 2267 - 2269CHIANG, KLDELLOCA, CJSCHWETTMANN, FN
- [8] RELATION BETWEEN SURFACE ROUGHNESS AND SPECULAR REFLECTANCE AT NORMAL INCIDENCEJOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (02) : 123 - +BENNETT, HEPORTEUS, JO
- [9] EVALUATION OF SILICON-WAFER SURFACE-ROUGHNESSJOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS, 1993, 38 (12) : 1066 - 1070SAMITSU, Y
- [10] INFLUENCE OF SURFACE-ROUGHNESS ON TRANSMISSION AND REFLECTANCE SPECTRA OF ADSORBED SPECIESJOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS II, 1973, 69 (01): : 65 - 78DIGNAM, MJMOSKOVIT.M