ADAPTATION OF AN ANNULAR DARK FIELD DETECTOR CAPABLE OF SINGLE-ELECTRON COUNTING TO A HIGH-RESOLUTION FIELD-EMISSION SCANNING ELECTRON-MICROSCOPY

被引：0
|
作者：
REICHELT, R
ENGEL, A
AEBI, U
机构：
来源：
INSTITUTE OF PHYSICS CONFERENCE SERIES | 1988年 / 93期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The application of a high resolution scanning electron microscope can be extended towards quantitative studies of unstained biological samples by incorporating an annular dark field detector capable of single-electron counting. Due to the high efficiency and sensitivity of this detector low-dose images of unstained matter can be recorded.
引用
收藏
页码：33 / 34
页数：2
相关论文
共 50 条
  • [1] ADAPTATION OF AN ANNULAR DARK FIELD DETECTOR CAPABLE OF SINGLE-ELECTRON COUNTING TO A HIGH-RESOLUTION FIELD-EMISSION SCANNING ELECTRON-MICROSCOPY
    REICHELT, R
    ENGEL, A
    AEBI, U
    EUREM 88, VOLS 1-3: TUTORIALS, INSTRUMENTATION AND TECHNIQUES / PHYSICS AND MATERIALS / BIOLOGY, 1988, 93 : 33 - 34
  • [2] Symposium on High-Resolution Field-Emission Scanning Electron Microscopy in Biology
    Erlandsen, SL
    SCANNING, 1997, 19 (05) : 323 - 323
  • [3] FIELD-EMISSION SCANNING ELECTRON-MICROSCOPY OF LEPTOSPIRA
    KONISHI, H
    YOSHII, Z
    TANAKA, S
    JOURNAL OF ELECTRON MICROSCOPY, 1977, 26 (03): : 236 - 236
  • [4] HIGH-RESOLUTION DETECTION OF UNCOATED METAPHASE CHROMOSOMES BY MEANS OF FIELD-EMISSION SCANNING ELECTRON-MICROSCOPY
    RIZZOLI, R
    RIZZI, E
    FALCONI, M
    GALANZI, A
    BARATTA, B
    LATTANZI, G
    VITALE, M
    MANZOLI, L
    MAZZOTTI, G
    CHROMOSOMA, 1994, 103 (06) : 393 - 400
  • [5] High-resolution field-emission scanning electron microscopy of nuclear pore complex
    Ris, H
    SCANNING, 1997, 19 (05) : 368 - 375
  • [6] HIGH-RESOLUTION DARK-FIELD ELECTRON-MICROSCOPY
    DUBOCHET, J
    JOURNAL OF MICROSCOPY-OXFORD, 1973, 98 (AUG): : 334 - 344
  • [7] EXPECTED CONTRIBUTION OF THE FIELD-EMISSION GUN TO HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
    ZEMLIN, F
    MICRON, 1994, 25 (03) : 223 - 226
  • [8] FIELD-EMISSION GUN FOR ELECTRON-MICROSCOPY
    DENIZART, M
    SONIER, F
    TRINQUIER, J
    JOUFFREY, B
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1976, 1 (03): : 523 - 524
  • [9] FIELD-EMISSION CANNON FOR ELECTRON-MICROSCOPY
    DENIZART, M
    SONIER, F
    TRINQUIER, J
    JOUFFREY, B
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1976, 1 (03): : A7 - A7
  • [10] FIELD-EMISSION GUN FOR ELECTRON-MICROSCOPY
    DENIZART, M
    SONIER, F
    TRINQUIER, J
    JOUFFREY, B
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1979, 4 (03): : A13 - A13
12345