ANALYSIS OF FRACTAL CHARACTERISTICS OF FRACTURED SURFACES BY SECONDARY-ELECTRON LINE SCANNING

被引：26

作者：

HUANG, ZH

TIAN, JF

WANG, ZG

机构：

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 1989年 / 118卷

关键词：

D O I：

10.1016/0921-5093(89)90053-1

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：19 / 24

页数：6

共 50 条

[1] STUDY OF IRREGULAR SURFACES BY SECONDARY-ELECTRON LINE SCANNING
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[2] FRACTAL CHARACTERISTICS OF FRACTURED SURFACES
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[9] AN IMAGING SECONDARY-ELECTRON DETECTOR FOR THE SCANNING ELECTRON-MICROSCOPE
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[10] CONTRAST OF SECONDARY-ELECTRON IMAGE OF SCANNING ELECTRON-MICROSCOPE
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