ELECTROMIGRATION OF GRAIN-BOUNDARIES IN ALUMINUM (99.995 PERCENT)

被引：4
|
作者：
PIERI, JC [1 ]
NIAZI, A [1 ]
JOUTY, R [1 ]
机构：
[1] UNIV SCI & TECH LANGUEDOC,LAB PHYS METAUX,MONTPELLIER,FRANCE
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1975年 / 27卷 / 02期
关键词：
D O I：
10.1002/pssa.2210270209
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：383 / 391
页数：9
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