ATOMIC-RESOLUTION IMAGING OF CLOSE-PACKED METAL-SURFACES BY SCANNING TUNNELING MICROSCOPY

被引:201
|
作者
WINTTERLIN, J [1 ]
WIECHERS, J [1 ]
BRUNE, H [1 ]
GRITSCH, T [1 ]
HOFER, H [1 ]
BEHM, RJ [1 ]
机构
[1] UNIV MUNICH,INST KRISTALLOG & MINERAL,D-8000 MUNICH 2,FED REP GER
关键词
D O I
10.1103/PhysRevLett.62.59
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:59 / 62
页数:4
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